Document Type : Research Paper

Author

Faculty Member - NOET (National organization for educational testint)

10.22054/jem.2025.79211.3533

Abstract

Objective: to find a new method to reduce data processing time and calculate the facility index and discriminant index of questions in large-scale tests.
methods: using the statistical method of simple random sampling (SRS) in the calculation of facility index and discriminant index with the classical test analysis method and producing a computer program to run the test sample with the large-scale data set.
Results: The results showed that this Significantly reduced processing time. For example, the question that took 7393 minutes (more than 133 hours - 5 days and nights) and gave a P index of 0.50, with 10 iterations and only an average time of 129.2 minutes, calculated the average value of this index to be 0.503.
Conclusion: Combining the statistical method of simple random sampling (SRS) with the classical test analysis (CTT) method reduces the data processing time, and this method can strongly recommended to use for nationwide organizations such as those that hold tests at the national level.
Keywords: CTT, Simple Random Sampling, Large-Scale Data, Process Time.

Keywords